Auger spectroscopy is an electron spectroscopy method based on an analysis of the energy distribution of electrons resulting from the Auger effect .
By the method of obtaining information about the surface, analysis methods are divided into emission methods, which use particle emission as a result of exposure to various factors (temperature, electric field), and sounding, based on particle emission or radiation, acting on the surface under study. Auger electron spectroscopy refers to sounding methods. It is based on the analysis of the energy distribution of electrons emitted by the test substance under the action of a beam of primary electrons, and the selection from the general energy spectrum of those that arose as a result of the Auger process. Their energy is determined by the energy structure of the shells of atoms participating in the process, and the current, to a first approximation, by the concentration of such atoms.
Auger processes occur during the bombardment of a solid surface by slow electrons with an energy E from 10 to 10,000 eV. The bombardment of solids in vacuum is accompanied by secondary electron emission . The composition of the secondary electrons emitted, in addition to the actual secondary electrons, includes elastically and inelastically scattered primary electrons.
Content
The nature of Auger electrons
When a material surface is bombarded with electrons with an energy sufficient to ionize one of the inner shells of an atom, for example, K, a primary vacancy arises, which is instantly (in 10 β16 β10 β14 s) filled by an electron transferred from another shell of the atom, for example M. As a result, a secondary vacancy arises. If E K and E M are the energies needed to transfer an electron from K and M levels to infinity, then the energy released during this transition is equal to E K - E M. This energy difference can be distributed across different channels. On the one hand, in the form of the released quantum of characteristic x-ray radiation, hv = E K - EM (radiation transition), and on the other hand, it is transferred to the electron of the outer shell of the atom, for example N (non-radiative transition or Auger transition). Energy | E K - E M | - E N can be positive (or equal to zero). In this case, the electron is emitted into a vacuum and registered as an Auger electron. The probability of its exit depends on the sequence number Z of the atoms of the material under study. Since the probability of a radiative transition with increasing Z increases (in proportion to Z 4 ), the probability of the appearance of an Auger transition decreases. So, for light elements, it is about 95%, and for elements with Z> 70 it does not exceed 10%. The depth of exit of Auger electrons d 0 in the range of energies that are of interest for electron Auger spectroscopy is 5 - 10 monatomic layers. Therefore, we can say that the information obtained by this method relates to the surface region of the sample under study.
The emitted electrons of an element that arise as a result of the Auger process are always characterized by certain values ββof energy. Hence, if we analyze the energies of the electrons emitted by the substance under the action of a beam of primary electrons, select from the general energy spectrum those electrons that have arisen as a result of the Auger process and determine their energies, we can conclude that there is one or another element on the surface.
Factors Affecting Auger Electron Emission Rate
The intensity of the emission of Auger electrons is significantly influenced by various factors, such as the dependence of the cross section of ionization of the internal levels of atoms on the energy of primary electrons, the backscattered electron flux, the probability of the transition of an atom to an unexcited state with the appearance of a photon, and other processes.
Dependence of the level ionization cross section on the electron energy of the primary beam
Since the value of the energy of primary electrons E is an important factor in the formation of primary vacancies in atoms, its change should significantly affect the magnitude of the current of Auger electrons.
Influence of the angle of incidence of primary electrons on the number of Auger electrons
The geometry of the process has a significant effect on the Auger electron current, namely, the angle of incidence of electrons on the sample and the angle of registration of Auger electrons. We are talking about the angle between the direction of the primary electron beam and the normal to the surface under study and the angle between the normal and the direction of the Auger electrons entering the detector.
Literature
- T.A. Carlson; per. from English: I. A. Brytov, N. I. Komyak, V. V. Korablev. Photoelectron and Auger spectroscopy. - L .: Mechanical Engineering, 1981. - 431 p.
- Paris, E.S. Auger effect. - Tash. : Fan, 1969 .-- 211 p.
- Zigban K., Nordling K., Falman A. et al. Electron spectroscopy. - M .: Mir, 1971. - 493 p.
- Popov V.F., Gorin Yu.N. Processes and installations of electron-ion technology. - M .: Higher. school, 1988 .-- 255 p. - ISBN 5-06-001480-0 .
- J. Maan, V. Spicer, A. Liebsh et al. Electron and ion spectroscopy of solids / L. Firmens, J. Wannick, W. Deceiser. - M .: Mir, 1981. - 467 p.
Links
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- Paparazzo, E. Comment on 'AES and SAM microanalysis of structure ceramics by thinning and coating the backside.' Yu and Jin (Eng.) // Surface and Interface Analysis : journal. - 2001 .-- December ( vol. 31 , no. 12 ). - P. 1110-1111 . - DOI : 10.1002 / sia.1144 .