X-ray fluorescence analysis (XRD) is one of the modern spectroscopic methods for studying a substance in order to obtain its elemental composition, that is, its elemental analysis . Using it, various elements can be found from beryllium (Be) to uranium (U). The X-ray powder diffraction method is based on the collection and subsequent analysis of the spectrum arising from the irradiation of the test material with x-ray radiation . When interacting with high-energy photons, the atoms of a substance go into an excited state, which manifests itself in the form of a transition of electrons from lower orbitals to higher energy levels up to ionization of the atom. In an excited state, the atom abides for an extremely short time, of the order of one microsecond, after which it returns to a calm position (ground state). In this case, the electrons from the outer shells fill the vacant spots, and the excess energy is either emitted as a photon, or the energy is transferred to another electron from the outer shells ( Auger electron ) [ specify ] . In addition, each atom emits a photon with an energy of a strictly defined value, for example, iron when irradiated with X-rays emits photons Kα = 6.4 keV. Further, according to the energy and the number of quanta, they judge the structure of matter.
As a radiation source, both x-ray tubes and isotopes of any elements can be used. Since each country has its own requirements for the import and export of emitting isotopes, in the production of X-ray fluorescence technology, they have recently been trying to use, as a rule, an X-ray tube. The tubes can be either with a rhodium or copper , molybdenum , silver or other anode . The tube anode, in some cases, is selected depending on the type of task (elements requiring analysis) for which this device will be used. For different groups of elements, different values of current and voltage on the tube are used. To study light elements, it is enough to set the voltage to 10 kV, for medium 20-30 kV, for heavy - 40-50 kV. In addition, in the study of light elements, the atmosphere has a great influence on the spectrum; therefore, the chamber with the sample is either vacuumized or filled with helium . After excitation, the spectrum is recorded on a special detector. The better the spectral resolution of the detector, the more accurately it will be able to separate photons from different elements from each other, which in turn will affect the accuracy of the device itself. Currently [ when? ] The best possible resolution of the detector is 123 eV.
After hitting the detector, the photon is converted into a voltage pulse, which in turn is counted by the counting electronics and finally transmitted to the computer. Below is an example of a spectrum obtained by analyzing a corundum mortar (Al 2 O 3 content is more than 98%, Ca , Ti concentration is about 0.05%). From the peaks of the obtained spectrum, it is possible to qualitatively determine which elements are present in the sample. To obtain an accurate quantitative content, it is necessary to process the obtained spectrum using a special calibration program (quantitative calibration of the instrument). The calibration program must be preliminarily created using standard samples whose elemental composition is precisely known. Simplified, in a quantitative analysis, the spectrum of an unknown substance is compared with the spectra obtained by irradiating standard samples, thus obtaining information on the quantitative composition of the substance.
X-ray fluorescence method is widely used in industry, scientific laboratories. Due to simplicity, the possibility of rapid analysis, accuracy, the absence of complex sample preparation, the scope of its application continues to expand.
Content
- 1 History
- 2 Application
- 3 See also
- 4 notes
- 5 Links
History
For the first time, the description of the XRD method of quantitative analysis was published in 1928 by scientists Glocker and Schreiber, and the X-ray fluorescence device was created only in 1948 by Friedman and Burks. He used a Geiger counter as a detector and showed sufficient sensitivity to the atomic numbers of element nuclei. In the 1960s, RFA spectrometers began to use a vacuum or helium medium to enable the determination of light elements, as well as to use lithium fluoride crystals for diffraction and chromium and rhodium X-ray fluorescence tubes to excite the long-wavelength range. In the 1970s, a silicon lithium drift detector (Si (Li)) was invented, which provides a fairly high sensitivity without the need for an analyzer crystal, but having a slightly lower energy resolution.
With the advent of computers, the entire analytical part was automated and control began to be carried out from the keyboard or the instrument panel. XRF devices became so popular that they were even included in the Apollo 15 and 16 missions.
Modern interplanetary spacecraft are also equipped with similar spectrometers, which makes it possible to determine the chemical composition of rocks on other planets.
In recent years, software for X-ray fluorescence analysis of the composition based on the method of fundamental parameters has appeared. The essence of the method is to solve a system of differential equations that relate the intensity of X-rays at a certain wavelength to the concentration of an element in a sample (taking into account the influence of other elements). This method is suitable for quality control of samples with a known composition, since a standard with a similar composition is required for calibration (calibration) of the analyzer. [one]
Application
- Ecology and environmental protection : determination of heavy metals in soils , sediments, water , aerosols, etc.
- Geology and mineralogy : qualitative and quantitative analysis of soils, minerals, rocks, etc.
- Metallurgy and the chemical industry : quality control of raw materials, production process and finished products
- Paint and Varnish Industry: Lead Paint Analysis
- Jewelry industry: measuring concentrations of precious metals
- Oil industry: determination of oil and fuel pollution
- Food Industry : Determination of Toxic Metals in Food Ingredients
- Agriculture : trace element analysis in soils and agricultural products
- Archeology : elemental analysis, dating of archaeological finds
- Art : the study of paintings, sculptures, for analysis and examinations
See also
- X-ray analysis
- Spectroscopy
- Spectrometer
- X-ray fluorescence spectrometer
- Wave dispersion spectrometer
- Portable spectrometer
- Fluorescence
- Gold analyzer
- X-ray detector
- X-ray photoelectron spectroscopy
Notes
- ↑ Hans A. van Sprang Fundamental parameter methods in XRF spectroscopy // Advances in X-ray Analysis, Vol. 42, 2000